ABSOLUTE DISTANCE MEASUREMENTS BY VARIABLE WAVELENGTH INTERFEROMETRY

被引：40
|
作者：
BIEN, F [1 ]
CAMAC, M [1 ]
CAULFIELD, HJ [1 ]
EZEKIEL, S [1 ]
机构：
[1] MIT,CAMBRIDGE,MA 02139
来源：
APPLIED OPTICS | 1981年 / 20卷 / 03期
关键词：
D O I：
10.1364/AO.20.000400
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
引用
收藏
页码：400 / 403
页数：4
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