ABSOLUTE DISTANCE MEASUREMENTS BY VARIABLE WAVELENGTH INTERFEROMETRY

被引:40
作者
BIEN, F [1 ]
CAMAC, M [1 ]
CAULFIELD, HJ [1 ]
EZEKIEL, S [1 ]
机构
[1] MIT,CAMBRIDGE,MA 02139
来源
APPLIED OPTICS | 1981年 / 20卷 / 03期
关键词
D O I
10.1364/AO.20.000400
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
引用
收藏
页码:400 / 403
页数:4
相关论文
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