LOW-ENERGY ELECTRON-MICROSCOPY OF SURFACES

被引：4

作者：

TELIEPS, W ^{[1
]}

BAUER, E ^{[1
]}

机构：

[1] TECH UNIV CLAUSTHAL,INST PHYS,D-3392 CLAUSTHAL ZELLERFE,FED REP GER

来源：

关键词：

D O I：

10.1016/0039-6028(88)90557-2

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

引用

页码：512 / 513

页数：2

共 7 条

[1] THE RESOLUTION OF THE LOW-ENERGY ELECTRON REFLECTION MICROSCOPE
BAUER, E
[J]. ULTRAMICROSCOPY, 1985, 17 (01) : 51 - 56
[2] BAUER E, 1987, 5TH P PFEFF C BRUG S, V1, P99
[3] DIRECT OBSERVATION OF THE PHASE-TRANSITION BETWEEN THE (7X7) AND (1X1) STRUCTURES OF CLEAN (111) SILICON SURFACES
OSAKABE, N
TANISHIRO, Y
YAGI, K
HONJO, G
[J]. SURFACE SCIENCE, 1981, 109 (02) : 353 - 366
[4] TELIEPS W, 1987, OPTIK, V77, P93
[5] AN ANALYTICAL REFLECTION AND EMISSION UHV SURFACE ELECTRON-MICROSCOPE
TELIEPS, W
BAUER, E
[J]. ULTRAMICROSCOPY, 1985, 17 (01) : 57 - 65
[6] SURFACE IMAGING WITH LEEM
TELIEPS, W
[J]. APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 1987, 44 (01): : 55 - 61
[7] KINETICS OF THE (7X7)-][- (1X1) TRANSITION ON SI(111)
TELIEPS, W
BAUER, E
[J]. BERICHTE DER BUNSEN-GESELLSCHAFT-PHYSICAL CHEMISTRY CHEMICAL PHYSICS, 1986, 90 (03): : 197 - 200