LOW-ENERGY ELECTRON-MICROSCOPY OF SURFACES

被引：4
|
作者：
TELIEPS, W [1 ]
BAUER, E [1 ]
机构：
[1] TECH UNIV CLAUSTHAL,INST PHYS,D-3392 CLAUSTHAL ZELLERFE,FED REP GER
来源：
SURFACE SCIENCE | 1988年 / 200卷 / 2-3期
关键词：
D O I：
10.1016/0039-6028(88)90557-2
中图分类号：
O64 [物理化学（理论化学）、化学物理学];
学科分类号：
070304 ; 081704 ;
摘要：
引用
收藏
页码：512 / 513
页数：2
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