NOISE MODELING IN SUBMICROMETER-GATE FETS

被引：31
作者：
CARNEZ, B
CAPPY, A
FAUQUEMBERGUE, R
CONSTANT, E
SALMER, G
机构：
来源：
IEEE TRANSACTIONS ON ELECTRON DEVICES | 1981年 / 28卷 / 07期
关键词：
D O I：
10.1109/T-ED.1981.20431
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：784 / 789
页数：6
相关论文
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