THIN-FILM COATINGS - ALGORITHMS FOR THE DETERMINATION OF REFLECTANCE AND TRANSMITTANCE, AND THEIR DERIVATIVES

被引：23

作者：

DUPOISOT, H

MORIZET, J

机构：

[1] CNRS, LTPS/CNAM, Paris

来源：

APPLIED OPTICS | 1979年 / 18卷 / 15期

关键词：

D O I：

10.1364/AO.18.002701

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

The paper deals with the specular optical properties of thin dielectric or metallic multilayer coatings. Recurrent formulas are given for reflectance, transmittance, and their derivatives with respect to thicknesses, indices, incidence, and wavelength. Because of its simplicity and flexibility, the proposed method is particularly well fitted for use in a digital computer and for optimization programs. © 1979 Optical Society of America.

引用

页码：2701 / 2704

页数：4

共 8 条

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[2] Abeles F, 1950, ANN PHYS-PARIS, V5, P706
[3] GENERALIZED EQUATIONS FOR CALCULATION OF ABSORPTANCE, REFLECTANCE, AND TRANSMITTANCE OF A NUMBER OF PARALLEL SURFACES
CADMAN, TW
SADOWSKI, D
[J]. APPLIED OPTICS, 1978, 17 (04): : 531 - 537
[4] DUPOISOT H, 1975, THESIS PARIS
[5] THIN-FILM OPTICAL COATINGS .1. OPTICAL COATING STABILITIES
MOUCHART, J
[J]. APPLIED OPTICS, 1977, 16 (09): : 2486 - 2490
[6] Rouard P., 1937, ANN PHYS, V7, P291
[7] VANDERLAAN CJ, 1978, APPL OPTICS, V17, P538, DOI 10.1364/AO.17.000538
[8] [No title captured]

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