CHARACTERIZATION OF OPTICAL THIN-FILMS

被引：256
作者：
PULKER, HK
机构：
[1] Balzers Ltd., Balzers
来源：
APPLIED OPTICS | 1979年 / 18卷 / 12期
关键词：
D O I：
10.1364/AO.18.001969
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
Various properties of dielectric thin films are discussed in this paper: Refractive index and absorption coefficient, light scattering, structure, microstructure, density, gas sorption, chemical composition, homogeneity, adhesion, hardness and mechanical stress, and environmental influences. © 1979 Optical Society of America.
引用
收藏
页码：1969 / 1977
页数：9
相关论文
共 86 条
[1]  
AHRENS H, 1973, APPL PHYS, V1, P69
[2]  
AHRENS H, 1974, THESIS TU HANNOVER
[3]  
ANDERS H, 1965, APPL OPT, V4, P819
[4]   PRODUCTION OF LOW SCATTERING DIELECTRIC MIRRORS USING ROTATING VANE PARTICLE FILTRATION [J].
BARR, WP .
JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1969, 2 (12) :1112-&
[5]  
BAUER E, 1957, ERGEBNISSE HOCHVAKUU, P39
[6]  
Bauer G, 1934, ANN PHYS-BERLIN, V19, P434
[7]   USE OF HAFNIUM DIOXIDE IN MULTILAYER DIELECTRIC REFLECTORS FOR NEAR ULTRAVIOLET [J].
BAUMEISTER, P ;
ARNON, O .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1977, 14 (01) :195-195
[8]   USE OF HAFNIUM DIOXIDE IN MULTILAYER DIELECTRIC REFLECTORS FOR NEAR UV [J].
BAUMEISTER, P ;
ARNON, O .
APPLIED OPTICS, 1977, 16 (02) :439-444
[9]  
BLACK OW, 1968, INFRARED PHYS, V8, P209
[10]   PROPRIETES OPTIQUES ET STRUCTURE DE COUCHES MINCES DE FLUORURE DE LANTHANE [J].
BOURG, A ;
BARBAROUX, N ;
BOURG, M .
OPTICA ACTA, 1965, 12 (02) :151-+
123456789