ON THE IMPROVEMENT OF RESOLUTION IN ELECTRON DIFFRACTION CAMERAS

被引:43
作者
HILLIER, J
BAKER, RF
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10.1063/1.1707628
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O59 [应用物理学];
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页码:12 / 22
页数:11
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共 4 条
[1]   Electron diffraction and surface structure. [J].
Finch, GI ;
Quarrell, AG ;
Wilman, H .
TRANSACTIONS OF THE FARADAY SOCIETY, 1935, 31 (02) :1051-1080
[2]  
FINCH GI, 1933, P ROY SOC LOND A MAT, V141, P399
[3]  
FINCH GI, 1937, ERG EXAKT NATURWISS, V16, P353
[4]   A diffraction adapter for the electron microscope [J].
Hillier, J ;
Baker, RF ;
Zworykin, VK .
JOURNAL OF APPLIED PHYSICS, 1942, 13 (09) :571-577