SENSITIVE DETECTION SYSTEM FOR SOFT-X-RAY APPEARANCE POTENTIAL SPECTROSCOPY

被引：5

作者：

CHAMBERL.MB ^{[1
]}

BAUN, WL ^{[1
]}

机构：

[1] USAF,MAT LAB,DAYTON,OH 45433

来源：

REVIEW OF SCIENTIFIC INSTRUMENTS | 1974年 / 45卷 / 04期

关键词：

D O I：

10.1063/1.1686681

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：545 / 547

页数：3

共 13 条

[1] X-RAY FILTERING TO IMPROVE SIGNAL-TO-NOISE IN SOFT-X-RAY APPEARANCE POTENTIAL SPECTROSCOPY [J].

BAUN, WL ;

CHAMBERLAIN, MB ;

SOLOMON, JS .

REVIEW OF SCIENTIFIC INSTRUMENTS, 1973, 44 (09) :1419-1420

[2] INTENSITY SINGULARITIES IN SOFT-X-RAY APPEARANCE POTENTIAL SPECTRA OF SAMARIUM N5 AND M5 LEVELS [J].

CHAMBERL.MB ;

BAUN, WL .

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1974, 11 (01) :441-445

[3] CHLORINE REACTIONS ON SI (111) SURFACE [J].

FLORIO, JV ;

ROBERTSO.WD .

SURFACE SCIENCE, 1969, 18 (02) :398-&

[4]

HOUSTON JE, TO BE PUBLISHED

[5]

LUKIRSKII AP, 1960, OPT SPECTROSC, V9, P343

[6] COMPACT APPEARANCE-POTENTIAL SPECTROMETER [J].

MUSKET, RG ;

TAATJES, SW .

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1972, 9 (02) :1041-&

[7] DIRECT COMPARISON OF AUGER-ELECTRON SPECTROSCOPY WITH APPEARANCE POTENTIAL SPECTROSCOPY [J].

MUSKET, RG .

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1972, 9 (02) :603-&

[8] L-SHELL SOFT-X-RAY APPEARANCE-POTENTIAL SPECTRA OF 3D TRANSITION-METALS [J].

PARK, RL ;

HOUSTON, JE .

PHYSICAL REVIEW B, 1972, 6 (04) :1073-&

[9] APPEARANCE POTENTIAL SPECTROSCOPY ON AN AUSTERE BUDGET [J].

PARK, RL ;

HOUSTON, JE .

SURFACE SCIENCE, 1971, 26 (02) :664-&

[10] SOFT X-RAY APPEARANCE POTENTIAL SPECTROMETER FOR ANALYSIS OF SOLID SURFACES [J].

PARK, RL ;

HOUSTON, JE ;

SCHREINER, DG .

REVIEW OF SCIENTIFIC INSTRUMENTS, 1970, 41 (12) :1810-+

← 1 2 →