SPECTROSCOPIC DETERMINATION OF THE OPTICAL DEFORMATION-POTENTIAL CONSTANT IN SEMICONDUCTORS

被引：8

作者：

BRAUN, D ^{[1
]}

RUHLE, WW ^{[1
]}

TRALLEROGINER, C ^{[1
]}

COLLET, J ^{[1
]}

机构：

[1] LAB PHYS SOLIDE,F-31077 TOULOUSE,FRANCE

来源：

PHYSICAL REVIEW LETTERS | 1991年 / 67卷 / 17期

关键词：

D O I：

10.1103/PhysRevLett.67.2335

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

The optical deformation-potential constant, otherwise inaccessible in undoped materials, is measured in CdSe by optical spectroscopy with subpicosecond time resolution. The phonon-assisted transitions from B to A excitons occur with a decay time of 0.9 ps, determined by pump-and-probe experiments. An analytic expression for the transition time is obtained. Since the Frohlich interaction is symmetry forbidden, we use a nonpolar optical Hamiltonian and extract a deformation-potential constant of d0 = 32 eV.

引用

页码：2335 / 2338

页数：4

共 16 条

[1] RESONANT INTERVALLEY SCATTERING IN GAAS [J].