THEORY AND EXPERIMENTS ON SHOT NOISE IN SEMICONDUCTOR JUNCTION DIODES AND TRANSISTORS

被引：47

作者：

GUGGENBUEHL, W

STRUTT, MJO

机构：

来源：

PROCEEDINGS OF THE INSTITUTE OF RADIO ENGINEERS | 1957年 / 45卷 / 06期

关键词：

D O I：

10.1109/JRPROC.1957.278483

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：839 / 854

页数：16

共 32 条

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[3]

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[4]

FONGER W, 1956, TRANSISTORS, V1, P239

[5]

GIACOLETTO LJ, 1956, TRANSISTORS, V1, P296

[6]

GUGGENBUEHL W, 1956, NACHRICHTENTECHNISCH, V5, P34

[7]

GUGGENBUEHL W, 1955, THESIS SWISS FEDERAL

[8]

GUGGENBUEHL W, 1955, AEU-ARCH ELEKTRON UB, V9, P259

[9]

Guggenbuhl W., 1956, AEU-ARCH ELEKTRON UB, V10, P483

[10]

GUGGENBUHL W, 1956, NACHRICHTENTECH FACH, V5, P30