MEASUREMENT OF CHARGE DENSITIES IN ATOMS AND MOLECULES BY ELECTRON AND X-RAY DIFFRACTION

被引：0
|
作者：
BONHAM, RA
机构：
来源：
RECORD OF CHEMICAL PROGRESS | 1969年 / 30卷 / 03期
关键词：
D O I：
暂无
中图分类号：
O6 [化学];
学科分类号：
0703 ;
摘要：
引用
收藏
页码：185 / &
相关论文
共 50 条
  • [31] X-ray diffraction measurement at 0.20 K
    Naher, S
    Suzuki, H
    Mizuno, M
    Xue, Y
    Fujishita, H
    PHYSICA B-CONDENSED MATTER, 2003, 329 : 1612 - 1613
  • [32] STRAIN MEASUREMENT BY X-RAY DIFFRACTION METHODS
    GREENOUGH, GB
    AERONAUTICAL QUARTERLY, 1949, 1 (03): : 211 - 224
  • [33] Measurement of coating thickness with X-ray diffraction
    Witte, M.
    POWDER DIFFRACTION, 2023, 38 (02) : 112 - 118
  • [34] MICROBEAM X-RAY DIFFRACTION MEASUREMENT OF STRAIN
    Noyan, I. C.
    ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES, 2002, 58 : C24 - C24
  • [35] X-RAY DIFFRACTION AND STRESS MEASUREMENT.
    Maeder, Gerard
    Chemica scripta, 1985, 26 A : 23 - 31
  • [36] INSTRUMENT FOR MEASUREMENT OF X-RAY DIFFRACTION PATTERNS
    BENNETT, JA
    REVIEW OF SCIENTIFIC INSTRUMENTS, 1949, 20 (12): : 908 - 910
  • [37] Measurement of charge density distribution of mesulergine, a dopamine agonist, by X-ray diffraction.
    Stevens, CLK
    Zhu, NJ
    Stevens, ED
    ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 2003, 225 : U517 - U518
  • [38] X-RAY AND ELECTRON DIFFRACTION DATA FOR SEPIOLITE
    BRINDLEY, GW
    AMERICAN MINERALOGIST, 1959, 44 (5-6) : 495 - 500
  • [39] SAPPHIRE BY COMBINED ELECTRON AND X-RAY DIFFRACTION
    Nakashima, P. N. H.
    Streltsov, V. A.
    Johnson, A. W. S.
    ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES, 2002, 58 : C173 - C173
  • [40] X-RAY MEASUREMENT OF SOIL DENSITIES IN MODELS.
    Krinitzsky, E.L.
    Journal of Materials (Changed to Journal of Testing & Evaluation), 1972, 7 (02): : 119 - 130
12345