CLUSTER FORMATION OF LI ON THE SI(111)7X7 SURFACE

被引:44
作者
HASEGAWA, Y
KAMIYA, I
HASHIZUME, T
SAKURAI, T
TOCHIHARA, H
KUBOTA, M
MURATA, Y
机构
[1] STM Group, The Institute for Solid State Physics, The University of Tokyo, Roppongi
[2] The Institute for Solid State Physics, The University of Tokyo, Roppongi
来源
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS | 1990年 / 8卷 / 01期
关键词
D O I
10.1116/1.577074
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
Using a field ion-scanning tunneling microscope (FI-STM), the adsorption process of Li on the Si(111) 7 X 7 surface has been studied. At the initial stage, trimers are formed preferentially in the faulted half of the 7 X 7 unit cell. At higher coverages, these trimers coalesce to form six-atom and nine-atom clusters across the interface between the faulted and unfaulted halves. It is suggested, based on the careful study of the adsorption sites, that the Si adatoms of the dimer-adatom-stacking fault (DAS) model may be removed upon the Li adsorption. © 1990, American Vacuum Society. All rights reserved.
引用
收藏
页码:238 / 240
页数:3
相关论文
共 14 条
[1]   ATOM-RESOLVED SURFACE-CHEMISTRY STUDIED BY SCANNING TUNNELING MICROSCOPY AND SPECTROSCOPY [J].
AVOURIS, P ;
WOLKOW, R .
PHYSICAL REVIEW B, 1989, 39 (08) :5091-5100
[2]   STUDY OF THE SI(111) 7X7 SURFACE-STRUCTURE BY ALKALI-METAL ADSORPTION [J].
DAIMON, H ;
INO, S .
SURFACE SCIENCE, 1985, 164 (01) :320-326
[3]   FIELD ION-SCANNING TUNNELING MICROSCOPY OF ALKALI-METAL ADSORPTION ON THE SI(100) SURFACE [J].
HASHIZUME, T ;
HASEGAWA, Y ;
KAMIYA, I ;
IDE, T ;
SUMITA, I ;
HYODO, S ;
SAKURAI, T ;
TOCHIHARA, H ;
KUBOTA, M ;
MURATA, Y .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1990, 8 (01) :233-237
[4]   HYDROGEN ADSORPTION AND SURFACE-STRUCTURES OF SILICON [J].
IBACH, H ;
ROWE, JE .
SURFACE SCIENCE, 1974, 43 (02) :481-492
[5]  
KAMIYA I, IN PRESS
[6]  
KOEHLER UK, 1988, PHYS REV LETT, V60, P2499
[7]   RHEED STUDY OF ALKALI-METALS ON SI(111) SURFACE [J].
MIZUNO, S ;
ICHIMIYA, A .
APPLIED SURFACE SCIENCE, 1988, 33-4 :38-44
[8]   SCANNING TUNNELING MICROSCOPE EQUIPPED WITH A FIELD-ION MICROSCOPE [J].
SAKURAI, T ;
HASHIZUME, T ;
KAMIYA, I ;
HASEGAWA, Y ;
IDE, T ;
MIYAO, M ;
SUMITA, I ;
SAKAI, A ;
HYODO, S .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1989, 7 (03) :1684-1688
[9]   STRUCTURAL-ANALYSIS OF SI(111)-7X7 BY UHV-TRANSMISSION ELECTRON-DIFFRACTION AND MICROSCOPY [J].
TAKAYANAGI, K ;
TANISHIRO, Y ;
TAKAHASHI, M ;
TAKAHASHI, S .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1985, 3 (03) :1502-1506
[10]  
TOCHIHARA H, 1989, SURF SCI, V215, pL323, DOI 10.1016/0039-6028(89)90262-8