INSB-CDTE INTERFACES - A COMBINED STUDY BY SOFT-X-RAY PHOTOEMISSION, LOW-ENERGY ELECTRON-DIFFRACTION, AND RAMAN-SPECTROSCOPY

被引：26

作者：

MACKEY, KJ

ZAHN, DRT

ALLEN, PMG

WILLIAMS, RH

RICHTER, W

WILLIAMS, RS

机构：

[1] RHEIN WESTFAL TH AACHEN,INST PHYS 1,D-5100 AACHEN,FED REP GER

[2] UNIV CALIF LOS ANGELES,DEPT PHYS SCI,LOS ANGELES,CA 90024

来源：

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 1987年 / 5卷 / 04期

关键词：

D O I：

10.1116/1.583719

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：1233 / 1238

页数：6

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