DETECTION OF EXCESS CRYSTALLINE AS AND SB IN III-V OXIDE INTERFACES BY RAMAN-SCATTERING

被引：99

作者：

FARROW, RL

CHANG, RK

MROCZKOWSKI, S

POLLAK, FH

机构：

[1] YALE UNIV,DEPT ENGN & APPL SCI,NEW HAVEN,CT 06520

[2] YESHIVA UNIV,BELFER GRAD SCH SCI,DEPT PHYS,NEW YORK,NY 10033

来源：

APPLIED PHYSICS LETTERS | 1977年 / 31卷 / 11期

关键词：

D O I：

10.1063/1.89542

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：768 / 770

页数：3

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