THERMALLY STIMULATED CURRENT MEASUREMENTS AND THEIR CORRELATION WITH EFFICIENCY AND DEGRADATION IN GAP LEDS

被引：47

作者：

FABRE, E ^{[1
]}

BHARGAVA, RN ^{[1
]}

机构：

[1] PHILIPS LABS,BRIARCLIFF MANOR,NY 10510

来源：

APPLIED PHYSICS LETTERS | 1974年 / 24卷 / 07期

关键词：

D O I：

10.1063/1.1655201

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：322 / 324

页数：3

共 13 条

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[2]

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[5]

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[6]

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[7]

FABRE E, 1973, C ELECTRONIC MATERIA

[8] INADVERTENT DEEP CENTERS IN N-TYPE GAP FROM SCHOTTKY-BARRIER PHOTOCAPACITANCE [J].

HAMILTON, B ;

SMITH, BL .

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[9]

KUKIMOTO H, 1972, APPL PHYS LETT, V21, P257

[10]

Monemar B., 1972, Journal of Luminescence, V5, P472, DOI 10.1016/0022-2313(72)90010-5

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