RADIATION-DAMAGE PROBLEMS IN ELECTRON-MICROSCOPY

被引：19
作者：
HOWIE, A [1 ]
机构：
[1] UNIV PAUL SABATIER TOULOUSE,CNRS,PROPRE LAB,OPT ELECTR LAB,F-31055 TOULOUSE,FRANCE
来源：
REVUE DE PHYSIQUE APPLIQUEE | 1980年 / 15卷 / 02期
关键词：
D O I：
10.1051/rphysap:01980001502029100
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
引用
收藏
页码：291 / 295
页数：5
相关论文
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