THE OPTICAL CONSTANTS OF THIN METALLIC FILMS DEPOSITED BY EVAPORATION

被引:23
作者
CLEGG, PL
机构
来源
PROCEEDINGS OF THE PHYSICAL SOCIETY OF LONDON SECTION B | 1952年 / 65卷 / 394期
关键词
D O I
10.1088/0370-1301/65/10/304
中图分类号
Q [生物科学];
学科分类号
07 ; 0710 ; 09 ;
摘要
引用
收藏
页码:774 / 781
页数:8
相关论文
共 11 条
[1]   PHOTOELECTRIC ANALYSIS OF ELLIPTICALLY POLARIZED LIGHT [J].
ARCHARD, JF ;
CLEGG, PL ;
TAYLOR, AM .
PROCEEDINGS OF THE PHYSICAL SOCIETY OF LONDON SECTION B, 1952, 65 (394) :758-768
[2]   INTERFEROMETRIC DETERMINATION OF THE APPARENT THICKNESS OF THIN METALLIC FILMS [J].
AVERY, DG .
NATURE, 1949, 163 (4154) :916-916
[3]   A TORSION BALANCE FOR WEIGHING EVAPORATED FILMS [J].
CLEGG, PL ;
CROOK, AW .
JOURNAL OF SCIENTIFIC INSTRUMENTS, 1952, 29 (06) :201-202
[4]  
DRUDE P, 1894, ANN PHYS-LEIPZIG, V51, P77
[7]   Research on the degradation of vacuum-metallized metallic layers by means of super-microscope and electron interferences [J].
Hass, G .
KOLLOID-ZEITSCHRIFT, 1942, 100 (02) :230-242
[8]   Studies on the structure of thin metallic films by means of the electron microscope [J].
Picard, RG ;
Duffendack, OS .
JOURNAL OF APPLIED PHYSICS, 1943, 15 (06) :291-305
[9]  
RAYLEIGH, 1902, SCI PAPERS, V3, P63
[10]   THE THICKNESS MEASUREMENT OF THIN FILMS BY MULTIPLE BEAM INTERFEROMETRY [J].
SCOTT, GD ;
MCLAUCHLAN, TA ;
SENNETT, RS .
JOURNAL OF APPLIED PHYSICS, 1950, 21 (09) :843-846