NONRADIATIVE RECOMBINATION IN AMORPHOUS-SEMICONDUCTORS AT FINITE TEMPERATURES

被引:0
|
作者
DICKMANN, SM
机构
[1] State Enterprise for Research and Production KVANT
关键词
D O I
10.1016/0375-9601(93)90018-U
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
The basic exponential factor for the recombination rate is calculated exactly within the scope of the multiple-level recombination model. The result contains essentially a nonlinear temperature dependence for the exponent power and is valid at temperatures T of the order of 100 K or higher.
引用
收藏
页码:371 / 374
页数:4
相关论文
共 50 条
  • [31] THEORY OF PHOTOCONDUCTIVITY AND PHOTOLUMINESCENCE OF AMORPHOUS-SEMICONDUCTORS AT LOW-TEMPERATURES
    BARANOVSKII, SD
    FRITZSCHE, H
    LEVIN, EI
    RUZIN, IM
    SHKLOVSKII, BI
    ZHURNAL EKSPERIMENTALNOI I TEORETICHESKOI FIZIKI, 1989, 96 (04): : 1362 - 1380
  • [32] MAGNETORESISTANCE IN AMORPHOUS-SEMICONDUCTORS
    MEHRA, RM
    SHYAM, R
    MATHUR, PC
    THIN SOLID FILMS, 1983, 100 (02) : 81 - 109
  • [33] DEFECTS IN AMORPHOUS-SEMICONDUCTORS
    ADLER, D
    JOURNAL OF NON-CRYSTALLINE SOLIDS, 1980, 35-6 (JAN-) : 819 - 824
  • [34] MULTILAYER AMORPHOUS-SEMICONDUCTORS
    CHEN, KJ
    MAO, GM
    LI, ZF
    CHEN, H
    DU, JF
    ZANG, XR
    THIN SOLID FILMS, 1988, 163 : 55 - 60
  • [35] VOIDS IN AMORPHOUS-SEMICONDUCTORS
    SHEVCHIK, NJ
    PAUL, W
    JOURNAL OF NON-CRYSTALLINE SOLIDS, 1974, 16 (01) : 55 - 71
  • [36] SWITCHING IN AMORPHOUS-SEMICONDUCTORS
    PLATAKIS, NS
    JOURNAL OF NON-CRYSTALLINE SOLIDS, 1978, 27 (03) : 331 - 346
  • [37] IDEAL AMORPHOUS-SEMICONDUCTORS
    COHEN, MH
    SINGH, J
    YONEZAWA, F
    JOURNAL OF NON-CRYSTALLINE SOLIDS, 1980, 35-6 (JAN-) : 55 - 60
  • [38] AMORPHOUS-SEMICONDUCTORS REVISITED
    ALLAN, R
    IEEE SPECTRUM, 1977, 14 (05) : 40 - 45
  • [39] THEORY OF AMORPHOUS-SEMICONDUCTORS
    ADLER, D
    SOLAR CELLS, 1980, 2 (03): : 199 - 226
  • [40] DEFECTS IN AMORPHOUS-SEMICONDUCTORS
    ROBERTSON, J
    PHILOSOPHICAL MAGAZINE B-PHYSICS OF CONDENSED MATTER STATISTICAL MECHANICS ELECTRONIC OPTICAL AND MAGNETIC PROPERTIES, 1985, 51 (02): : 183 - 192