MICRO-FURNACE FOR SINGLE-CRYSTAL DIFFRACTION MEASUREMENTS

被引：24

作者：

LISSALDE, F ^{[1
]}

ABRAHAMS, SC ^{[1
]}

BERNSTEIN, JL ^{[1
]}

机构：

[1] BELL TEL LABS INC,MURRAY HILL,NJ 07974

来源：

JOURNAL OF APPLIED CRYSTALLOGRAPHY | 1978年 / 11卷 / FEB期

关键词：

D O I：

10.1107/S0021889878012625

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

引用

页码：31 / 34

页数：4

共 11 条

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[3]

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[4]

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[5]

LISSALDE F, UNPUBLISHED

[6] FURNACE FOR X-RAY-DIFFRACTION STUDIES OF SINGLE-CRYSTALS [J].

LUCAS, BW .

JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1973, 6 (11) :1097-1099

[7] HEMISPHERICAL FURNACE FOR HIGH-TEMPERATURE SINGLE CRYSTAL X-RAY DIFFRACTION STUDIES [J].

LYNCH, RW ;

MOROSIN, B .

JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1971, 4 (OCT1) :352-&

[8] NEW SINGLE-CRYSTAL HEATER FOR KAPPA DIFFRACTOMETER [J].

RICE, CE ;

ROBINSON, WR .

JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1977, 10 (JUN1) :208-208

[9]

RUDMAN R, 1976, LOW TEMPERATURE XRAY

[10] HIGH-TEMPERATURE X-RAY-DIFFRACTION FURNACE USING A THERMAL-IMAGE TECHNIQUE [J].

WATANABE, A ;

SHIMAZU, M .

JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1976, 9 (DEC1) :466-469

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