IMPROVED CRYSTALS OF MERCURIC IODIDE GROWN IN A HORIZONTAL FURNACE FROM VAPOR-PHASE USING TEMPERATURE OSCILLATION METHOD

被引：32

作者：

BEINGLASS, I

DISHON, G

HOLZER, A

SCHIEBER, M

机构：

来源：

JOURNAL OF CRYSTAL GROWTH | 1977年 / 42卷 / DEC期

关键词：

D O I：

10.1016/0022-0248(77)90191-9

中图分类号：

O7 [晶体学];

学科分类号：

0702 ; 070205 ; 0703 ; 080501 ;

摘要：

引用

页码：166 / 170

页数：5

共 7 条

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[2] VAPOR GROWTH OF HGI-2 BY PERIODIC SOURCE OR CRYSTAL TEMPERATURE OSCILLATION [J].

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[3] PURIFICATION, GROWTH, AND CHARACTERIZATION OF ALPHA-MERCURIC-IODIDE CRYSTALS FOR GAMMA-RAY DETECTION [J].

SCHIEBER, M ;

CARLSTON, RC ;

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LLACER, J .

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[4]

Schieber M., 1977, CRYSTAL GROWTH MATER, V2, P279

[5]

SCHOLZ H, 1974, ACTA ELECTRONICS, V17, P69

[6] EVAPORATIVE DEGRADATION OF HGI2 X-RAY DETECTORS [J].

SCOTT, RS ;

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APPLIED PHYSICS LETTERS, 1975, 27 (02) :99-100

[7] VAPOR GROWTH OF DOPED MERCURIC IODIDE-CRYSTALS BY TEMPERATURE OSCILLATION METHOD [J].

VANDENBERG, L ;

SCHNEPPLE, WF ;

ORTALE, C ;

SCHIEBER, M .

JOURNAL OF CRYSTAL GROWTH, 1977, 42 (DEC) :160-165

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