HYDROGEN DEPTH PROFILING USING O-18 IONS

Nuclear resonant reaction analysis techniques for hydrogen depth profiling in solid materials typically have used N-15 ion beams at 6.40 MeV and F-19 ion beams at 6.42 MeV, which require a tandem accelerator. We report a new technique using an O-18 ion beam at a resonance energy of 2.70 MeV, which requires only a single stage accelerator. Improved values of the nuclear parameters for the 2.70 MeV (O-18) and 6.40 MeV (N-15) resonances are reported. The beam energy spread was investigated for different ions and ion charge states and found to scale with the charge state. Data obtained using atomic and molecular gas targets reveal the research potential of Doppler spectroscopy. Examples of hydrogen depth profiling in solid materials using N-15 and O-18 ion beams are presented.