QUASI-NONDESTRUCTIVE READOUT OF HOLOGRAPHICALLY STORED INFORMATION IN PHOTOREFRACTIVE BI12SIO20 CRYSTALS

被引：33

作者：

DELBOULBE, A ^{[1
]}

FROMONT, C ^{[1
]}

HERRIAU, JP ^{[1
]}

MALLICK, S ^{[1
]}

HUIGNARD, JP ^{[1
]}

机构：

[1] CTR UNIV ORSAY,INST OPT,F-91403 ORSAY,FRANCE

来源：

APPLIED PHYSICS LETTERS | 1989年 / 55卷 / 08期

关键词：

D O I：

10.1063/1.102441

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

收藏

页码：713 / 715

页数：3

相关论文

共 16 条

[1] ELECTRICAL AND OPTICAL PROPERTIES OF BI12SIO20
ALDRICH, RE
HOU, SL
HARVILL, ML
[J]. JOURNAL OF APPLIED PHYSICS, 1971, 42 (01) : 493 - &
[2] THERMAL FIXING OF HOLOGRAPHIC GRATINGS IN BI12SIO20
ARIZMENDI, L
[J]. JOURNAL OF APPLIED PHYSICS, 1989, 65 (02) : 423 - 427
[3] TEMPERATURE-DEPENDENCE OF THE DYNAMIC-RESPONSE OF THE PHOTOREFRACTIVE SIGNAL IN BI12SIO20
ARIZMENDI, L
POWELL, RC
[J]. JOURNAL OF APPLIED PHYSICS, 1987, 62 (03) : 896 - 899
[4] CHARACTERIZATION OF DEEP LEVELS IN BI12GEO20 BY PHOTOINDUCED CURRENT TRANSIENT SPECTROSCOPY
BENJELLOUN, N
TAPIERO, M
ZIELINGER, JP
LAUNAY, JC
MARSAUD, F
[J]. JOURNAL OF APPLIED PHYSICS, 1988, 64 (08) : 4013 - 4023
[5] PROPERTIES OF PURE AND DOPED BI12GEO2O AND BI12SIO20 CRYSTALS
GRABMAIER, BC
OBERSCHMID, R
[J]. PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1986, 96 (01): : 199 - 210
[6] HOLOGRAM FIXING PROCESS AT ROOM-TEMPERATURE IN PHOTOREFRACTIVE BI12SIO20 CRYSTALS
HERRIAU, JP
HUIGNARD, JP
[J]. APPLIED PHYSICS LETTERS, 1986, 49 (18) : 1140 - 1142
[7] Kamshilin A. A., 1981, Soviet Physics - Solid State, V23, P1811
[8] ELECTRICAL CONTROL IN PHOTOFERROELECTRIC MATERIALS FOR OPTICAL STORAGE
MICHERON, F
MAYEUX, C
TROTIER, JC
[J]. APPLIED OPTICS, 1974, 13 (04): : 784 - 787
[9] ELECTRICAL CONTROL OF FIXATION AND ERASURE OF HOLOGRAPHIC PATTERNS IN FERROELECTRIC MATERIALS
MICHERON, F
BISMUTH, G
[J]. APPLIED PHYSICS LETTERS, 1972, 20 (02) : 79 - &
[10] Staebler D. L., 1977, Holographic recording materials, P101