TIME LAG OF ELECTRICAL BREAKDOWN IN CRYOGENIC LIQUIDS

被引：0
|
作者：
HAYASHI, K
KUBO, U
YOSHINO, K
INUISHI, Y
机构：
来源：
ELECTRICAL ENGINEERING IN JAPAN | 1978年 / 98卷 / 03期
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D O I：
10.1002/eej.4390980302
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
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页码：8 / 13
页数：6
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