RESOLUTION OF INTERELEMENT SPECTRAL OVERLAPS BY HIGH-RESOLUTION INDUCTIVELY-COUPLED PLASMA-MASS SPECTROMETRY

被引：16

作者：

MORITA, M ^{[1
]}

ITO, H ^{[1
]}

LINSCHEID, M ^{[1
]}

OTSUKA, K ^{[1
]}

机构：

[1] JOEL LTD JAPAN,AKISHIMA,TOKYO 196,JAPAN

来源：

ANALYTICAL CHEMISTRY | 1994年 / 66卷 / 09期

关键词：

D O I：

10.1021/ac00081a038

中图分类号：

O65 [分析化学];

学科分类号：

070302 ; 081704 ;

摘要：

The design instrumentation and performance of a high-resolution ICP mass spectrometer in resolving interelement spectral overlaps is reported. A high resolution of 43 000 was obtained by using a double-focusing magnetic sector mass analyzer coupled with an ICP ionization source through a three-stage differential evacuation system and a Q-lens. Resolution of isobar overlaps is demonstrated for Se-76/Ge-76 and Sm-150/Nd-150 at a 1 ppm concentration level.

引用

页码：1588 / 1590

页数：3

共 6 条

[1] INDUCTIVELY COUPLED PLASMA AS AN ION-SOURCE FOR HIGH-RESOLUTION MASS-SPECTROMETRY [J].