REDUCED INTERVALLEY SCATTERING RATES IN STRAINED SI/SIXGE1-X QUANTUM-WELLS AND ENHANCEMENT OF ELECTRON-MOBILITY - A MODEL CALCULATION

被引:20
作者
BASU, PK
PAUL, SK
机构
[1] Institute of Radio Physics and Electronics, University of Calcutta, Calcutta 700 009, 92, Acharya Prafulla Chandra Road
关键词
D O I
10.1063/1.350919
中图分类号
O59 [应用物理学];
学科分类号
摘要
In a Si/Si0.5Ge0.5 quantum well grown on a [100] oriented Si0.75Ge0.25 buffer, the four valleys having longitudinal mass normal to the [100] direction are lifted from the remaining two valleys. As a consequence, the intervalley f scattering between these two groups of valleys, the strongest in bulk Si, occurs only when the electrons in the subbands reach a high threshold energy. A high value of mobility limited mainly by acoustic phonon scattering is thus expected and is also obtained from the model calculation described in the present work. It is shown that higher values of the mobility may be obtained for wider wells.
引用
收藏
页码:3617 / 3619
页数:3
相关论文
共 21 条
[11]   ESCAPE FROM QUANTUM-WELLS VIA POLAR OPTICAL PHONON-SCATTERING [J].
LIANG, L ;
LENT, CS .
JOURNAL OF APPLIED PHYSICS, 1990, 68 (04) :1741-1749
[12]   SCATTERING OF CONDUCTION ELECTRONS BY LATTICE VIBRATIONS IN SILICON [J].
LONG, D .
PHYSICAL REVIEW, 1960, 120 (06) :2024-2032
[13]   IMPURITY AND LATTICE SCATTERING PARAMETERS AS DETERMINED FROM HALL AND MOBILITY ANALYSIS IN N-TYPE SILICON [J].
NORTON, P ;
BRAGGINS, T ;
LEVINSTEIN, H .
PHYSICAL REVIEW B, 1973, 8 (12) :5632-5653
[14]   ENHANCEMENT-MODE AND DEPLETION-MODE PARA-CHANNEL GEXSI1-X MODULATION-DOPED FETS [J].
PEARSALL, TP ;
BEAN, JC .
IEEE ELECTRON DEVICE LETTERS, 1986, 7 (05) :308-310
[16]   EFFECT OF CONTINUUM RESONANCES ON HOT CARRIER TRANSPORT IN QUANTUM WELLS [J].
POROD, W ;
LENT, CS .
SOLID-STATE ELECTRONICS, 1988, 31 (3-4) :359-362
[17]   THE ELECTRON PHONON INTERACTION IN QUASI-2-DIMENSIONAL SEMICONDUCTOR QUANTUM-WELL STRUCTURES [J].
RIDLEY, BK .
JOURNAL OF PHYSICS C-SOLID STATE PHYSICS, 1982, 15 (28) :5899-5917
[18]   MOBILITY OF ELECTRONS IN A QUANTIZED SILICON INVERSION LAYER DUE TO PHONON-SCATTERING [J].
ROYCHOUDHURY, D ;
BASU, PK .
PHYSICAL REVIEW B, 1980, 22 (12) :6325-6329
[19]  
SAJAL K, 1991, J APPL PHYS, V70, P3977
[20]  
SCHAFFLER E, 1991, APPL PHYS LETT, V58, P398