共 50 条
- [1] IN-LINE STATISTICAL PROCESS-CONTROL AND FEEDBACK FOR VLSI INTEGRATED-CIRCUIT MANUFACTURING SEVENTH IEEE/CHMT INTERNATIONAL ELECTRONIC MANUFACTURING TECHNOLOGY SYMPOSIUM: INTEGRATION OF THE MANUFACTURING FLOW - FROM RAW MATERIAL THROUGH SYSTEMS-LEVEL ASSEMBLY, 1989, : 70 - 75
- [2] IN-LINE STATISTICAL PROCESS-CONTROL AND FEEDBACK FOR VLSI INTEGRATED-CIRCUIT MANUFACTURING IEEE TRANSACTIONS ON COMPONENTS HYBRIDS AND MANUFACTURING TECHNOLOGY, 1990, 13 (03): : 484 - 489
- [5] Comprehensive methodology for integrated circuit in-line defect classification MICROELECTRONIC YIELD, RELIABILITY, AND ADVANCED PACKAGING, 2000, 4229 : 53 - 59
- [6] MODULAR PACKAGING APPROACH FOR DUAL IN-LINE INTEGRATED CIRCUITS SAE TRANSACTIONS, 1968, 76 : 91 - &
- [8] IMPROVING THE PERFORMANCE OF AN INTEGRATED-CIRCUIT MANUFACTURING LINE AT&T TECHNICAL JOURNAL, 1987, 66 (05): : 39 - 48
- [9] In-line analytics improve manufacturing GENETIC ENGINEERING & BIOTECHNOLOGY NEWS, 2008, 28 (15): : 52 - +
- [10] Switchable in-line monitor for multi-dimensional multiplexed photonic integrated circuit OPTICS EXPRESS, 2016, 24 (13): : 14841 - 14850