INTERFERENCE METHOD FOR MEASUREMENT OF THICKNESS VARIATIONS IN THIN LIQUID-FILMS

被引：6
|
作者：
FISHER, LR [1 ]
PARKER, NS [1 ]
SHARPLES, F [1 ]
机构：
[1] CSIRO, DIV APPL PHYS, SYDNEY, NSW 2070, AUSTRALIA
来源：
OPTICAL ENGINEERING | 1980年 / 19卷 / 06期
关键词：
Compendex;
D O I：
10.1117/12.7972613
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
INTERFEROMETRY
引用
收藏
页码：798 / 800
页数：3
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