GAAS-GAP HETEROJUNCTIONS

被引:24
作者
DAVIS, ME
ZEIDENBERGS, G
ANDERSON, RL
机构
[1] Wright-Patterson AFB, Avionics Lab, Ohio
[2] IBM Corp, New York, Hopewell Junction
[3] Escola Politecnica, Univ. de Sao Paulo, Sao Paulo
来源
PHYSICA STATUS SOLIDI | 1969年 / 34卷 / 01期
关键词
D O I
10.1002/pssb.19690340139
中图分类号
O469 [凝聚态物理学];
学科分类号
070205 ;
摘要
GaAsGaP n–n, n–p, and p–n heterojunctions were fabricated by growing GaAs onto GaP substrates using HCl as the transport agent in an open‐tube system. It is found that the conduction band is continuous at the interface. This is in contrast to reported discontinuities of 0.65 and 0.22 eV. A high concentration of interface states is present in such junctions as evidenced by the frequency dependence of capacitance, and the I–U characteristics. Photocurrent response is as expected in n(GaAs)–p(GaP) heterojunctions, but a modulation effect was observed in p(GaAs)–n(GaP) junctions. This effect is not well understood. Copyright © 1969 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim
引用
收藏
页码:385 / +
页数:1
相关论文
共 16 条
[1]  
ALFEROV ZI, 1967, FIZ TVERD TELA+, V8, P2813
[2]  
ALFEROV ZI, 1965, SOV PHYS-SOLID STATE, V7, P990
[3]   EXPERIMENTS ON GE-GAAS HETEROJUNCTIONS [J].
ANDERSON, RL .
SOLID-STATE ELECTRONICS, 1962, 5 (SEP-O) :341-&
[4]   EXCESS TUNNEL CURRENT IN SILICON ESAKI JUNCTIONS [J].
CHYNOWETH, A ;
LOGAN, RA ;
FELDMANN, WL .
PHYSICAL REVIEW, 1961, 121 (03) :684-&
[5]  
DONNELLY JP, 1967, T IEE, VED14, P63
[6]   EFFECT OF CRYSTAL ORIENTATION ON GE-GAAS HETEROJUNCTIONS [J].
FANG, FF ;
HOWARD, WE .
JOURNAL OF APPLIED PHYSICS, 1964, 35 (3P1) :612-&
[7]   PHOTOCURRENT SPECTRA OF GE-GAAS HETERO-JUNCTIONS [J].
LOPEZ, A ;
ANDERSON, RL .
SOLID-STATE ELECTRONICS, 1964, 7 (09) :695-700
[8]   INTERFACE STATES IN ABRUPT SEMICONDUCTOR HETEROJUNCTIONS [J].
OLDHAM, WG ;
MILNES, AG .
SOLID-STATE ELECTRONICS, 1964, 7 (02) :153-165
[9]   NGE-PGAAS HETEROJUNCTIONS [J].
RIBEN, AR ;
FEUCHT, DL .
SOLID-STATE ELECTRONICS, 1966, 9 (11-1) :1055-&
[10]   ELECTRICAL TRANSPORT IN NGE-PGAAS HETEROJUNCTIONS [J].
RIBEN, AR ;
FEUCHT, DL .
INTERNATIONAL JOURNAL OF ELECTRONICS, 1966, 20 (06) :583-&