ABSOLUTE MEASUREMENT OF THE (220)-LATTICE PLANE SPACING IN A SILICON CRYSTAL

被引：172
作者：
BECKER, P
DORENWENDT, K
EBELING, G
LAUER, R
LUCAS, W
PROBST, R
RADEMACHER, HJ
REIM, G
SEYFRIED, P
SIEGERT, H
机构：
来源：
PHYSICAL REVIEW LETTERS | 1981年 / 46卷 / 23期
关键词：
D O I：
10.1103/PhysRevLett.46.1540
中图分类号：
O4 [物理学];
学科分类号：
0702 ;
摘要：
引用
收藏
页码：1540 / 1543
页数：4
相关论文
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