EVALUATION OF SIGNAL-TO-NOISE RATIOS OF STEM IMAGES

被引：0

|

作者：

YAMAMURA, R ^{[1
]}

HIBINO, M ^{[1
]}

MARUSE, S ^{[1
]}

机构：

[1] NAGOYA UNIV,FAC ENGN,DEPT ELECTRON,CHIKUSA KU,NAGOYA,AICHI 464,JAPAN

来源：

JOURNAL OF ELECTRON MICROSCOPY | 1987年 / 36卷 / 05期

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中图分类号：

TH742 [显微镜];

学科分类号：

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页码：330 / 330

页数：1

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