NEW LOOK AT NOISE IN TRANSFERRED ELECTRON OSCILLATORS

被引：1

作者：

GNERLICH, HR ^{[1
]}

ONDRIA, J ^{[1
]}

机构：

[1] LEHIGH UNIV,BETHLEHEM,PA 18015

来源：

IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES | 1977年 / 25卷 / 12期

关键词：

D O I：

10.1109/TMTT.1977.1129259

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

收藏

页码：977 / 981

页数：5

相关论文

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[3] SEMICONDUCTOR IMPURITY ANALYSIS FROM LOW-FREQUENCY NOISE SPECTRA
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[J]. IEEE TRANSACTIONS ON ELECTRON DEVICES, 1971, ED18 (01) : 50 - &
[4] DECACQUERAY A, 1973, SOLID STATE ELECTRON, V5, P853
[5] GNERLICH HR, 1975, THESIS LEHIGH U
[6] GUPTA MS, 1972, THESIS U MICHIGAN
[7] A MICROWAVE SYSTEM FOR MEASUREMENTS OF AM AND FM NOISE SPECTRA
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[J]. IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 1968, MT16 (09) : 767 - &
[8] SWEET AA, 1970, P IEEE MAY