A DOUBLE-CRYSTAL X-RAY GONIOMETER FOR ACCURATE ORIENTATION DETERMINATION

被引：2

|

作者：

BOND, WL

机构：

来源：

PROCEEDINGS OF THE INSTITUTE OF RADIO ENGINEERS | 1950年 / 38卷 / 08期

关键词：

D O I：

10.1109/JRPROC.1950.234430

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

收藏

页码：886 / 889

页数：4

相关论文

共 50 条

[41] Determination of the critical thickness of misfit dislocation multiplication using in situ double-crystal x-ray diffraction
Mock, P
Tanner, BK
Li, CR
Keir, AM
Johnson, AD
Lacey, G
Clark, GF
Lunn, B
Hogg, JCH
SEMICONDUCTOR SCIENCE AND TECHNOLOGY, 1996, 11 (07) : 1051 - 1055
[42] VISUAL X-RAY DETERMINATION OF SINGLE CRYSTAL ORIENTATION
FIEDLER, R
CESKOSLOVENSKY CASOPIS PRO FYSIKU SEKCE A, 1967, 17 (05): : 527 - &
[43] DETERMINATION OF OPTICAL ORIENTATION USING A PIVOTING AND X-RAY 4-CYCLE GONIOMETER
MEREITER, K
PREISINGER, A
FORTSCHRITTE DER MINERALOGIE, 1984, 62 : 153 - 153
[44] INFLUENCE OF X-RAY FLUORESCENT RADIATION IN SINGLE AND DOUBLE-CRYSTAL SPECTROMETER EXPERIMENTS
BROGREN, G
EFIMOV, O
PERSSON, E
ARKIV FOR FYSIK, 1969, 39 (01): : 89 - &
[45] INTERFERENCE PEAKS IN DOUBLE-CRYSTAL X-RAY ROCKING CURVES OF LASER STRUCTURES
CHU, X
TANNER, BK
APPLIED PHYSICS LETTERS, 1986, 49 (26) : 1773 - 1775
[46] AN AUTOMATIC SCANNING DEVICE FOR X-RAY DIFFRACTION MEASUREMENTS WITH A DOUBLE-CRYSTAL SPECTROMETER
BROGREN, G
PERSSON, E
ARKIV FOR FYSIK, 1968, 37 (04): : 376 - &
[47] QUANTITATIVE DOUBLE-CRYSTAL X-RAY DISPERSION TOPOGRAPHY WITH A POINT FOCUS SOURCE
KUB, J
SOUREK, Z
JOURNAL OF CRYSTAL GROWTH, 1995, 151 (3-4) : 387 - 392
[48] IMPROVEMENT OF DETECTABILITY IN X-RAY SPECTRAL ANALYSIS USING DOUBLE-CRYSTAL SPECTROMETER
KLOCKENK.R
LAQUA, K
MASSMANN, H
SPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY, 1971, B 26 (09) : 577 - &
[49] A low-cost and flexible double-crystal monochromator for an x-ray beamline
Hwang, CS
Lin, FY
Lee, CH
Yu, KL
Hsieh, CH
Tseng, PK
Lin, JT
Pong, WF
REVIEW OF SCIENTIFIC INSTRUMENTS, 1998, 69 (03): : 1230 - 1235
[50] CHARACTERIZATION OF POROUS SILICON LAYERS BY MEANS OF X-RAY DOUBLE-CRYSTAL DIFFRACTOMETRY
SUGIYAMA, H
NITTONO, O
ISIJ INTERNATIONAL, 1989, 29 (03) : 223 - 228

← 1 2 3 4 5 →