MOBILITY MEASUREMENTS WITH A STANDARD CONTACT RESISTANCE PATTERN

被引:14
|
作者
LOOK, DC
机构
关键词
D O I
10.1109/EDL.1987.26588
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
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页码:162 / 164
页数:3
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