PHOTOELECTROCHEMICAL MICROSCOPY OF OXIDE-FILMS ON METALS - TI/TIO2 INTERFACE

被引：97

作者：

KOZLOWSKI, MR

TYLER, PS

SMYRL, WH

ATANASOSKI, RT

机构：

[1] UNIV MINNESOTA, DEPT CHEM ENGN & MAT SCI, MINNEAPOLIS, MN 55455 USA

[2] UNIV BELGRADE, INST ELECTROCHEM, ICTM, BELGRADE, YUGOSLAVIA

来源：

SURFACE SCIENCE | 1988年 / 194卷 / 03期

关键词：

D O I：

10.1016/0039-6028(88)90866-7

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

引用

页码：505 / 530

页数：26

共 43 条

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[3] OPTICAL INDEXES OF OXIDE-FILMS AS A FUNCTION OF THEIR CRYSTALLIZATION - APPLICATION TO ANODIC TIO2 (ANATASE)
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[4] BLONDEAU G, 1977, J MICROSC SPECT ELEC, V2, P27
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[7] LOCALIZED PHOTO-ELECTROCHEMICAL MEASUREMENTS OF PASSIVE FILMS ON TITANIUM
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[J]. JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1983, 130 (12) : 2358 - 2362
[8] AGING EFFECTS IN DEFECT-DOPED SEMICONDUCTING ELECTRODES
BUTLER, MA
[J]. JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1979, 126 (02) : 338 - 341
[9] PHOTOELECTROCHEMICAL IMAGING
BUTLER, MA
[J]. JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1984, 131 (09) : 2185 - 2190
[10] SUBBAND GAP RESPONSE OF TIO2 AND SRTIO3 PHOTOELECTRODES
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ABRAMOVICH, M
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JULIAO, JF
[J]. JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1981, 128 (01) : 200 - 204

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