INTERFEROMETRIC MEASUREMENTS OF OPTICALLY ROUGH SURFACES

被引：2
|
作者：
MUNNERLY.CR
GIVENS, MP
HOPKINS, RE
机构：
来源：
IEEE JOURNAL OF QUANTUM ELECTRONICS | 1969年 / QE 5卷 / 06期
关键词：
D O I：
10.1109/JQE.1969.1081974
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：359 / &
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