PICOSECOND RECOMBINATION OF PHOTO-EXCITED CARRIERS IN SPUTTERED ALPHA-SI-H

被引：0
|
作者：
DSOUZA, AI
ROE, MG
WIGEN, PE
MESSIER, R
机构：
[1] OHIO STATE UNIV,DEPT PHYS,COLUMBUS,OH 43210
[2] PENN STATE UNIV,MAT RES LAB,UNIVERSITY PK,PA 16802
来源：
SOLID STATE COMMUNICATIONS | 1987年 / 63卷 / 09期
关键词：
CHARGED CARRIER RELAXATION - MULTIPLE-TRAPPING MODEL - PHOTO-EXCITED CARRIERS - PICOSECOND RECOMBINATION - RF SPUTTERING - TWO-STEP RELAXATION PROCESS;
D O I：
10.1016/0038-1098(87)90902-1
中图分类号：
O469 [凝聚态物理学];
学科分类号：
070205 ;
摘要：
引用
收藏
页码：863 / 865
页数：3
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