KINETIC INDUCTANCE AND PENETRATION DEPTH OF THIN SUPERCONDUCTING FILMS MEASURED BY THZ-PULSE SPECTROSCOPY

被引:51
作者
BRORSON, SD
BUHLEIER, R
WHITE, JO
TROFIMOV, IE
HABERMEIER, HU
KUHL, J
机构
[1] Max-Planck-Institut für Festkörperforschung, Stuttgart
来源
PHYSICAL REVIEW B | 1994年 / 49卷 / 09期
关键词
D O I
10.1103/PhysRevB.49.6185
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
We measure the transmission of THz pulses through thin films of YBa2Cu3O7-delta at temperatures between 10 and 300 K. The pulses possess a usable bandwidth extending from approximately 0.1 to 1.5 THz (3.3-50 cm-1). Below T(c) we observe pulse reshaping caused by the kinetic inductance of the superconducting charge carriers. From transmission data, we extract values of the London penetration depth, as a function of temperature, and find that they agree well with a functional form [lambda(0)/lambda(T)]2 = 1 - (T/T(c))alpha, where lambda(0) = 148 nm and or = 2.
引用
收藏
页码:6185 / 6187
页数:3
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