A 1.66 mV FOM Output Cap-Less LDO With Current-Reused Dynamic Biasing and 20 ns Settling Time

被引:34
作者
Desai, Chirag [1 ,2 ]
Mandal, Debashis [1 ]
Bakkaloglu, Bertan [1 ]
Kiaei, Sayfe [1 ]
机构
[1] Arizona State Univ, Sch Elect Comp & Energy Engn, Tempe, AZ 85287 USA
[2] Qualcomm Technol Inc, QCT PMIC Design, San Diego, CA 92121 USA
来源
IEEE SOLID-STATE CIRCUITS LETTERS | 2018年 / 1卷 / 02期
关键词
Cross-coupled common-gate (CG) input stage; current-reused dynamic biasing; fast transient response; high slew rate; low-dropout (LDO) regulator;
D O I
10.1109/LSSC.2018.2813533
中图分类号
TP3 [计算技术、计算机技术];
学科分类号
0812 ;
摘要
A fully integrated output capacitor-less, nMOS regulation FET low-dropout (LDO) regulator with fast transient response for system-on-chip power regulation applications is presented. The error amplifier (EA) consists of a differential cross-coupled common-gate (CG) input stage achieving twice the transconductance and unity-gainbandwidth in comparison to a conventional differential common-source stage. The low input resistance of the CG EA improves stability of the LDO over a wide range of load currents. The LDO employs a current-reused dynamic biasing technique to further improve the load transient response, with no extra quiescent current. It is designed and fabricated in a 0.18-mu m CMOS technology for an input voltage range of 1.6-1.8 V, and an output voltage range of 1.4-1.6 V. Measured undershoot is 158 mV and settling time is 20 ns for 9-40 mA load change in 250 ps edge-time with zero load capacitance. The LDO core consumes 130 mu A of quiescent current, occupies 0.21 mm(2) die area, and sustains 0-50 pF of on-chip load capacitance.
引用
收藏
页码:50 / 53
页数:4
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