X-RAY-DIFFRACTION STUDIES OF THE STRUCTURE OF NANOMETER-SIZED CRYSTALLINE MATERIALS

被引：369
作者：
ZHU, X
BIRRINGER, R
HERR, U
GLEITER, H
机构：
来源：
PHYSICAL REVIEW B | 1987年 / 35卷 / 17期
关键词：
D O I：
10.1103/PhysRevB.35.9085
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
引用
收藏
页码：9085 / 9090
页数：6
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