INDEXED X-RAY-DIFFRACTION DATA FOR THE SIALON X-PHASE

被引:8
作者
ZANGVIL, A [1 ]
GAUCHKLER, LJ [1 ]
RUHLE, M [1 ]
机构
[1] MAX PLANCK INST MET RES,INST WERKSTOFFWISSENSCH,STUTTGART,FED REP GER
关键词
D O I
10.1007/BF00551748
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
引用
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页码:788 / 790
页数:3
相关论文
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