SEGREGATION AT THE CLEAN AND OXIDIZED PT0.5NI0.5(111) SURFACE STUDIED BY MEDIUM-ENERGY ION-SCATTERING

被引:3
|
作者
DECKERS, S [1 ]
HABRAKEN, FHPM [1 ]
VANDERWEG, WF [1 ]
VANDERGON, AWD [1 ]
PLUIS, B [1 ]
VANDERVEEN, JF [1 ]
机构
[1] FOM,DEPT ATOM & MOLEC PHYS,1098 SJ AMSTERDAM,NETHERLANDS
来源
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS | 1990年 / 45卷 / 1-4期
关键词
D O I
10.1016/0168-583X(90)90864-Q
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
Using medium-energy ion scattering in combination with shadowing and blocking, an oscillating segregation profile is observed on the Pt0.5Ni0.5 (111) surface with 75%, 27% and 53% Pt in the first three layers, respectively. After oxygen exposure at 400°C, the segregation profile is reversed and a Ni-O layer is found on top of two Pt-enriched layers. © 1990.
引用
收藏
页码:416 / 416
页数:1
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