THE FULL-USE-OF-SUITABLE-SPARES (FUSS) APPROACH TO HARDWARE RECONFIGURATION FOR FAULT-TOLERANT PROCESSOR ARRAYS

被引:23
作者
CHEAN, M [1 ]
FORTES, JAB [1 ]
机构
[1] PURDUE UNIV,SCH ELECT ENGN,W LAFAYETTE,IN 47907
关键词
Fault-tolerant; reconfiguration; redundancy; reliability; survivability;
D O I
10.1109/12.54851
中图分类号
TP3 [计算技术、计算机技术];
学科分类号
0812 ;
摘要
A general approach to hardware reconfiguration is proposed for VLSIAVSI fault-tolerant processor arrays. The technique, called FUSS (full use of suitable spares), uses an indicator vector, the surplus vector, to guide the replacement of faulty processors within an array. Analytical study of the general FUSS algorithm shows that there is a linear relationship between the array size and the area of interconnect required for reconfiguration to be 100% successful. In an instance of FUSS, called simple FUSS, reconfiguration is done by simply “shifting” up or down faulty processors along their corresponding columns according to the surplus vector's entries. The surplus vector is progressively updated after each column is reconfigured. The reconfiguration is successful when the surplus vector becomes null. Simple FUSS is discussed in detail and evaluated. Simulations show that when the number of faulty processors is equal to that of spare processors, simple FUSS can achieve a probability of survival as high as 99%; this is far better than the probability of survival of existing schemes with similar complexity in execution time and interconnection hardware. © 1990 IEEE
引用
收藏
页码:564 / 571
页数:8
相关论文
共 12 条
[1]  
CHEAN M, 1989, IEEE COMPUTER MA JAN
[2]  
CHEAN M, 1989, THESIS PURDUE U
[3]  
CHEAN M, 1989, JUN INT WORKSH HARDW, P30
[4]  
JERVIS L, 1988, OCT P INT WORKSH DEF
[5]  
Lombardi F., 1987, Proceedings of the Real-Time Systems Symposium (Cat. No.87CH2475-2), P44
[6]  
LOMBARDI F, 1987, 17TH P FTCS C PITTSB, P251
[7]  
LOPEZBENITEZ N, 1989, 19TH P INT S FAULT T, P545
[8]  
Negrini R., 1986, Wafer Scale Integration. Proceedings of the IFIP WG 10.5 Workshop, P207
[9]  
SAMI M, 1986, P IEEE, V74, P712, DOI 10.1109/PROC.1986.13533
[10]  
SAMI M, 1986, P IEEE INT S CIRC SY, P643