EVIDENCE FOR SURFACE MELTING DURING THE GROWTH OF HIGH T-C THIN-FILMS

被引：7

作者：

CHANDRASEKHAR, N ^{[1
]}

SCHLOM, DG ^{[1
]}

机构：

[1] PENN STATE UNIV,DEPT MAT SCI & ENGN,UNIVERSITY PK,PA 16802

来源：

PHYSICA C | 1994年 / 235卷

关键词：

D O I：

10.1016/0921-4534(94)91572-5

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

We present reflection high energy electron diffraction (RHEED) spot profile analyses, which show anomalous broadening over very short time scales. Our data can only be interpreted in terms of surface melting. The conclusions are consistent with the thermodynamic phase diagrams and with the vapor-liquid-solid (VLS) mechanism of crystal growth.

引用

页码：697 / 698

页数：2

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