PROBLEMS OF CONTROLLING THE OPTICAL-THICKNESS OF INFRARED COATINGS DURING DEPOSITION

被引:0
作者
ZHANG, KQ
ZHANG, FS
YAN, YX
机构
[1] Shanghai Institute of Technical Physics, Chinese Academy of Sciences, Shanghai, 200083
来源
APPLIED OPTICS | 1993年 / 32卷 / 28期
关键词
OPTICAL COATINGS; PROCESS CONTROL;
D O I
10.1364/AO.32.005579
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
Special problems that influence the accuracy of controlling the optical thickness of infrared coatings during deposition are discussed.
引用
收藏
页码:5579 / 5582
页数:4
相关论文
共 2 条
  • [1] OPTICAL THICKNESS CHANGES IN FRESHLY DEPOSITED LAYERS OF LEAD-TELLURIDE
    EVANS, CS
    HUNNEMAN, R
    SEELEY, JS
    [J]. JOURNAL OF PHYSICS D-APPLIED PHYSICS, 1976, 9 (02) : 321 - 328
  • [2] ZHANG K, 1988, THIN FILMS OPTICS, V1125, P45