CHARACTERIZATION OF THE NATIVE OXIDE OF CUINSE2 USING SYNCHROTRON RADIATION PHOTOEMISSION

被引:34
作者
NELSON, AJ
GEBHARD, S
KAZMERSKI, LL
COLAVITA, E
ENGELHARDT, M
HOCHST, H
机构
[1] UNIV CALABRIA,DEPT PHYS,I-87036 ARCAVACATA,ITALY
[2] UNIV WISCONSIN,CTR SYNCHROTRON RADIAT,STOUGHTON,WI 53589
关键词
D O I
10.1063/1.104122
中图分类号
O59 [应用物理学];
学科分类号
摘要
Synchrotron radiation soft x-ray photoemission spectroscopy was used to investigate the native oxide of n-type single-crystal CuInSe2. Photoemission measurements were acquired on the oxide surface before and after removal using sputter etching. Observed changes in the valence-band electronic structure as well as changes in the In 4d and Se 3d core lines were correlated with the interface chemistry at the oxide/CuInSe2 interface. These results show the native oxide to be composed of an In2O3 outer layer (no SeO2) with an additional Cu2Se interface layer.
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页码:1428 / 1430
页数:3
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