CHARACTERIZATION OF GOLD SURFACES FOR USE AS SUBSTRATES IN SCANNING TUNNELING MICROSCOPY STUDIES

被引：118

作者：

EMCH, R ^{[1
]}

NOGAMI, J ^{[1
]}

DOVEK, MM ^{[1
]}

LANG, CA ^{[1
]}

QUATE, CF ^{[1
]}

机构：

[1] STANFORD UNIV,DEPT APPL PHYS,STANFORD,CA 94305

来源：

JOURNAL OF APPLIED PHYSICS | 1989年 / 65卷 / 01期

关键词：

D O I：

10.1063/1.343379

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：79 / 84

页数：6

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