THE RECORDING AND ANALYSIS OF SYNCHROTRON X-RADIATION LAUE DIFFRACTION PHOTOGRAPHS

被引：234
|
作者：
HELLIWELL, JR
HABASH, J
CRUICKSHANK, DWJ
HARDING, MM
GREENHOUGH, TJ
CAMPBELL, JW
CLIFTON, IJ
ELDER, M
MACHIN, PA
PAPIZ, MZ
ZUREK, S
机构：
[1] UNIV YORK,DEPT PHYS,YORK YO1 5DD,N YORKSHIRE,ENGLAND
[2] UNIV LIVERPOOL,DEPT CHEM,LIVERPOOL L69 3BX,ENGLAND
[3] UNIV KEELE,DEPT PHYS,KEELE ST5 5BG,STAFFS,ENGLAND
[4] SERC,DARESBURY LAB,WARRINGTON WA4 4AD,CHESHIRE,ENGLAND
[5] UNIV MANCHESTER,INST SCI & TECHNOL,DEPT CHEM,MANCHESTER M60 1QD,LANCS,ENGLAND
来源：
JOURNAL OF APPLIED CRYSTALLOGRAPHY | 1989年 / 22卷
关键词：
D O I：
10.1107/S0021889889006564
中图分类号：
O6 [化学];
学科分类号：
0703 ;
摘要：
引用
收藏
页码：483 / 497
页数：15
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