Optical and interference total reflection in x-rays II

被引:0
作者
Schmid, E
机构
来源
ZEITSCHRIFT FUR KRISTALLOGRAPHIE | 1936年 / 94卷 / 2/3期
关键词
D O I
暂无
中图分类号
O7 [晶体学];
学科分类号
0702 ; 070205 ; 0703 ; 080501 ;
摘要
引用
收藏
页码:165 / 196
页数:32
相关论文
共 50 条
[31]   Interference appearances in X-rays [J].
Friedrich, W ;
Knipping, P ;
Laue, M .
ANNALEN DER PHYSIK, 1913, 41 (10) :971-988
[32]   'X-RAYS II' [J].
HANNON, N .
MINNESOTA REVIEW, 1990, (34-35) :26-26
[33]   DIFFERENTIAL-EQUATIONS DESCRIBING TOTAL EXTERNAL REFLECTION OF X-RAYS [J].
SMIRNOV, LA .
OPTIKA I SPEKTROSKOPIYA, 1977, 43 (03) :567-569
[34]   Total reflection of x-rays from nickel films of various thicknesses [J].
Edwards, HW .
PHYSICAL REVIEW, 1928, 32 (05) :0712-0714
[35]   STRUCTURE OF THIN EVAPORATED COPPER FILMS BY TOTAL REFLECTION OF X-RAYS [J].
PARRATT, LG .
PHYSICAL REVIEW, 1955, 99 (05) :1635-1635
[36]   WAVELENGTH IDENTIFICATION OF ULTRASOFT X-RAYS BY CRITICAL ANGLE OF TOTAL REFLECTION [J].
HERGLOTZ, HK .
JOURNAL OF APPLIED PHYSICS, 1967, 38 (12) :4565-&
[37]   Remarks on the work of H W Edwards on the total reflection of x-rays [J].
Kiessig, H .
ANNALEN DER PHYSIK, 1931, 11 (05) :645-648
[38]   STUDY OF ORGANIC FILMS BY USING TOTAL-REFLECTION OF X-RAYS [J].
EMELYANOV, Y ;
KHATKO, V ;
LUNEVICH, A ;
GLOBA, I .
SYNTHETIC METALS, 1993, 61 (1-2) :195-198
[39]   USE OF TOTAL REFLECTION AT CRITICAL ANGLE FOR DISPERSION OF ULTRASOFT X-RAYS [J].
HERGLOTZ, HK .
APPLIED SPECTROSCOPY, 1968, 22 (04) :363-&
[40]   PROBLEM OF PHASE JUMPS AT TOTAL INTERNAL-REFLECTION OF X-RAYS [J].
BEZIRGANIAN, PA ;
TSERUNIAN, MA .
PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1976, 35 (02) :K181-K182