Optical and interference total reflection in x-rays II

被引：0

作者：

Schmid, E

机构：

来源：

ZEITSCHRIFT FUR KRISTALLOGRAPHIE | 1936年 / 94卷 / 2/3期

关键词：

D O I：

暂无

中图分类号：

O7 [晶体学];

学科分类号：

0702 ; 070205 ; 0703 ; 080501 ;

摘要：

引用

页码：165 / 196

页数：32

共 50 条

[1] The total reflection of X-rays
Prins, JA
NATURE, 1927, 120 : 188 - 189
[2] Total reflection of x-rays on liquids
Steps, H
ANNALEN DER PHYSIK, 1933, 16 (08) : 949 - 972
[3] ON THE INTERFERENCE OF X-RAYS IN MULTIPLE REFLECTION OPTICS
DABAGOV, SB
KUMAKHOV, MA
NIKITINA, SV
PHYSICS LETTERS A, 1995, 203 (5-6) : 279 - 282
[4] Total reflection of x-rays from nickel films - Part II
Edwards, HW
PHYSICAL REVIEW, 1929, 33 (04): : 0463 - 0466
[5] PARALLELIZATION OF X-RAYS BY TOTAL EXTERNAL REFLECTION
PEREL, J
JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1973, 6 (02): : 171 - 173
[6] Total reflection of X-rays due to diffraction
Kawai, Jun
Kunimura, Shinsuke
ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES, 2008, 64 : C550 - C551
[7] THE TOTAL EXTERNAL REFLECTION EFFECT FOR X-RAYS
VINOGRADOV, AV
ZORYEV, NN
KOZHEVNIKOV, IV
YAKUSHKIN, IG
ZHURNAL EKSPERIMENTALNOI I TEORETICHESKOI FIZIKI, 1985, 89 (06): : 2124 - 2132
[8] SURFACE STUDIES OF SOLIDS BY TOTAL REFLECTION OF X-RAYS
PARRATT, LG
PHYSICAL REVIEW, 1954, 95 (02): : 359 - 369
[9] MONOCHROMATIZATION OF X-RAYS BY MEANS OF TOTAL EXTERNAL REFLECTION
SINAISKII, VM
GRIGORENKO, LP
INSTRUMENTS AND EXPERIMENTAL TECHNIQUES, 1976, 19 (05) : 1545 - 1547
[10] ANALYTICAL APPLICATION OF TOTAL REFLECTION AND POLARIZED X-RAYS
WOBRAUSCHEK, P
AIGINGER, H
FRESENIUS ZEITSCHRIFT FUR ANALYTISCHE CHEMIE, 1986, 324 (08): : 865 - 874