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HIGH-LEVEL NOISE SOURCE FOR CALIBRATION OF JOHNSON NOISE POWER THERMOMETERS
被引:2
作者
:
BLALOCK, TV
论文数:
0
引用数:
0
h-index:
0
机构:
OAK RIDGE NATL LAB,OAK RIDGE,TN 37830
OAK RIDGE NATL LAB,OAK RIDGE,TN 37830
BLALOCK, TV
[
1
]
BORKOWSKI, CJ
论文数:
0
引用数:
0
h-index:
0
机构:
OAK RIDGE NATL LAB,OAK RIDGE,TN 37830
OAK RIDGE NATL LAB,OAK RIDGE,TN 37830
BORKOWSKI, CJ
[
1
]
机构
:
[1]
OAK RIDGE NATL LAB,OAK RIDGE,TN 37830
来源
:
REVIEW OF SCIENTIFIC INSTRUMENTS
|
1978年
/ 49卷
/ 08期
关键词
:
D O I
:
10.1063/1.1135520
中图分类号
:
TH7 [仪器、仪表];
学科分类号
:
0804 ;
080401 ;
081102 ;
摘要
:
引用
收藏
页码:1046 / 1053
页数:8
相关论文
共 4 条
[1]
NEW METHOD OF JOHNSON NOISE THERMOMETRY
BORKOWSKI, CJ
论文数:
0
引用数:
0
h-index:
0
机构:
OAK RIDGE NATL LAB, OAK RIDGE, TN 37830 USA
BORKOWSKI, CJ
BLALOCK, TV
论文数:
0
引用数:
0
h-index:
0
机构:
OAK RIDGE NATL LAB, OAK RIDGE, TN 37830 USA
BLALOCK, TV
[J].
REVIEW OF SCIENTIFIC INSTRUMENTS,
1974,
45
(02)
: 151
-
162
[2]
MICROWAVE FIELD-EFFECT TRANSISTORS 1976
LIECHTI, CA
论文数:
0
引用数:
0
h-index:
0
机构:
HEWLETT PACKARD CO, SOLID STATE LAB, PALO ALTO, CA 94304 USA
HEWLETT PACKARD CO, SOLID STATE LAB, PALO ALTO, CA 94304 USA
LIECHTI, CA
[J].
IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES,
1976,
24
(06)
: 279
-
330
[3]
Thermal agitation of electric charge in conductors
Nyquist, H
论文数:
0
引用数:
0
h-index:
0
Nyquist, H
[J].
PHYSICAL REVIEW,
1928,
32
(01):
: 110
-
113
[4]
GATE NOISE IN FIELD EFFECT TRANSISTORS AT MODERATELY HIGH FREQUENCIES
VANDERZIEL, A
论文数:
0
引用数:
0
h-index:
0
VANDERZIEL, A
[J].
PROCEEDINGS OF THE IEEE,
1963,
51
(03)
: 461
-
&
←
1
→
共 4 条
[1]
NEW METHOD OF JOHNSON NOISE THERMOMETRY
BORKOWSKI, CJ
论文数:
0
引用数:
0
h-index:
0
机构:
OAK RIDGE NATL LAB, OAK RIDGE, TN 37830 USA
BORKOWSKI, CJ
BLALOCK, TV
论文数:
0
引用数:
0
h-index:
0
机构:
OAK RIDGE NATL LAB, OAK RIDGE, TN 37830 USA
BLALOCK, TV
[J].
REVIEW OF SCIENTIFIC INSTRUMENTS,
1974,
45
(02)
: 151
-
162
[2]
MICROWAVE FIELD-EFFECT TRANSISTORS 1976
LIECHTI, CA
论文数:
0
引用数:
0
h-index:
0
机构:
HEWLETT PACKARD CO, SOLID STATE LAB, PALO ALTO, CA 94304 USA
HEWLETT PACKARD CO, SOLID STATE LAB, PALO ALTO, CA 94304 USA
LIECHTI, CA
[J].
IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES,
1976,
24
(06)
: 279
-
330
[3]
Thermal agitation of electric charge in conductors
Nyquist, H
论文数:
0
引用数:
0
h-index:
0
Nyquist, H
[J].
PHYSICAL REVIEW,
1928,
32
(01):
: 110
-
113
[4]
GATE NOISE IN FIELD EFFECT TRANSISTORS AT MODERATELY HIGH FREQUENCIES
VANDERZIEL, A
论文数:
0
引用数:
0
h-index:
0
VANDERZIEL, A
[J].
PROCEEDINGS OF THE IEEE,
1963,
51
(03)
: 461
-
&
←
1
→